赛普拉斯低成本高可靠嵌入式闪存技术

Outline

1. Charge-trap eNVMs at Cypress

2. SONOS

    –Introduction

    –Key Macro Specs

    –High Reliability

3. eCT

     –Introduction

     –Key Macro Specs

     –High Reliability

4. Embedded NVM Solutions for Various Applications

Charge-trap eNVMs at Cypress

Cypress develops, uses and licenses two embedded NVM technologies

• SONOS and eCT,both are charge-trap non-volatile memories.

SONOS: Silicon Oxide Nitride Oxide Silicon 

• Originally developed at Sandia National Lab, CY acquired it in 1998.

• Available at 0.35µm, 0.13µm, 95nm, 65nm, 55nm, 40nm and 28nm process nodes.

• Shipped>1,200,000 wafers from foundry partners HHGrace, HLMC and UMC.

• Low cost, Lowpower, suitable for IoT, consumer, industrial, and automotive grade2/3 applications.

eCT : embedded  Charge Trap

• Former Spansion’s eNVM technology for automotive MCUs.

• Based on 6 generations of Mirror Bit technologies.

• In production (MCUs) at 40 nm node at UMC.

• Automotive Grade-1 qualified.

Key Features

SONOS Introduction

Silicon Oxide Nitride Oxide Silicon

• A planar, scalable MOS transistor with an ONO stack as the gate dielectric.

• Store captured charges in discrete traps in the nitride (N) layer through FN tunneling.

Low Cost, Low Power, High Security

• Lowest cost: Only 3~5 extra masks added into standard CMOS process.

• Lowest power: 7.5V program/erase voltage, low-current FN/FN program/erase operations.

• High Security: Resistant to decode by de-processing.

• Ideal solution for consumer, industrial and especially IoT SoCs.

> MCU, Smart Card,EEPROM, FPGA, NOR Flash, etc.

Key SONOS Macro Specs

55 nm SONOS Macro Power Consumption

• Balanced power consumption and performance (20ns Taa) for many applications

  −Three power-saving modes: hibernate, sleep and standby.

  −Low power read and program/erase operations to minimize active power.

  −Low power read operation with Vdd=1.08 V to1.32 V.

500hrs 225°C Yield w/ 50K Pre-cycling at 85 °C (55nm) 

*All dies pass reading on full 8Mb after 500hrs 225°C bake      

High Reliability

55-nm SONOS Macro Reliability

• Endurance passes 500K cycles at 85°C w/o ECC. Vt window > 1.2V after     500K cycling.

• Retention passes Automotive Grade-2 AEC Q100 requirement.

        > Vt window > 0.6 V after 500 hrs bake @ 225C with 50K pre-cycling.

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40-nm SONOS Macro Reliability

• Endurance passes 500K cycles  at 85°C w/o ECC. Vt window > 1.2V after  500K cycling.

• Retention passes Automotive Grade-2 AEC Q100 requirement

>Vt window > 0.6 V after 500 hrs bake @ 225C with 50K pre-cycling.

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28-nm SONOS Macro Reliability

• Endurance passes 10K cycles at 125°C, Vt window >1.4 V after cycling.

• Retention passes accelerated 48-hour bake at 250°C with > 0.7 V window left.

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55nm SONOS in Production Press Release

Customers NPI Status @ HLMC 55nm SONOS

• Engaged > 15 customers.

• 7 Customers signed contract to use

• 3 in mass production

• > 1,000 wafers started per month

SONOS eNVM Technology Availability

SONOS eNVM is scalable and proven in volume production on many nodes.

eCT Introduction

embedded Charge Trap

• Based on charge-trap technology proven in six generations of MirrorBit® NOR Flash memory

Ideal solution for high-performance automotive MCUs

• Fast 8 ns random access time from -40°C to 150°C junction temperature and 30 ms word programming speed

• Smallest eNVM bit cell in the industry, 0.053 sq. µm, at 40 nm node

• Automotive Grade-1 reliability

Applications

• Hybrid and electric vehicle motor control, instrument clusters, body control modules and HVAC

• In volume production on UMC 40LP process flow

Key eCT Macro Specs

 eCTReliability: 

Automotive Qualification Data

• Passed accelerated stress tests for Automotive Grade-1 per AEC-Q100 standard

40nm eCT in Production Press Release

Embedded NVM Solutions for Various Applications

Conclusion

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Cypress develops and licenses charge-trap NVM technologies and Flash macro IP

• Charge-trap NVMs serve in a wide range ofembedded applications

−SONOS: Consumer, Industrial SoCs

−eCT: high-performance automotive MCUs,Automotive Grade-1 reliability

• Technologies are scalable to advanced nodes

−SONOS in mass production from 0.35um to 55nm, engineering samples available on 40uLP & 28HLP

−eCT is in volume production on UMC 40LP process

• Low power for IoT: 0.9 V (40nm) or 1.2V(55nm) power supply, low-current operation, power-saving modes

• Cost-effective: 3~5 (SONOS) or 8 (eCT)extra masks beyond the standard CMOS.