SN54ABT8543 具有八路寄存总线收发器的扫描测试设备

KANA 发表于 2018-11-02 19:23:06

数据: Scan Test Devices With Octal Registered Bus Tranceivers 数据表

描述

The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers.

 

Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the device operates in the transparent mode when and are both low. When either or is high, the A data is latched. The B outputs are active when and are both low. When either or is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses , , and .

In the test mode, the normal operation of the SCOPETM registered bus transceiver is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54ABT8543 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8543 is characterized for operation from -40°C to 85°C.

 

 

 

特性

  • 德州仪器SCOPE TM 可测性产品系列的成员
  • 与IEEE兼容标准1149.1-1990(JTAG)测试访问端口和边界扫描架构
  • 在功能上等效于正常功能模式下的'F543和'ABT543
  • SCOPE TM 指令集
    • IEEE标准1149.1-1990必需指令,可选INTEST,CLAMP和HIGHZ
    • 带掩码选项的输入并行签名分析
    • 伪 - 从输出生成随机模式
    • 样本输入/切换输出
    • 输出的二进制计数
    • 偶数奇偶校验操作码
  • 每I /O两个边界扫描单元以提高灵活性
  • 最先进的EPIC-IIB TM BiCMOS设计显着降低功耗
  • 封装选项包括塑料小外形(DW)和收缩小外形(DL)封装,陶瓷芯片载体(FK)和标准陶瓷DIP s(JT)


SCOPE和EPIC-IIB是德州仪器公司的商标。

参数 与其它产品相比 边界扫描 (JTAG)

 
Technology Family
VCC (Min) (V)
VCC (Max) (V)
Bits (#)
ICC @ Nom Voltage (Max) (mA)
tpd @ Nom Voltage (Max) (ns)
IOL (Max) (mA)
Input Type
Output Type
Rating
Operating Temperature Range (C)
SN54ABT8543
ABT    
4.5    
5.5    
8    
38    
5.8    
64    
TTL    
TTL    
Military    
-55 to 125    

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