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Ultra Low Current dc Character
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2010-07-08
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Introduction
Safe operation of next-generation
sub-micron devices requires that
power dissipation and signal levels be
scaled accordingly. To successfully
characterize these devices and semi-
conductor processes, more precise
and noise free low current measure-
ments are needed. The Agilent 4156C
precision semiconductor parameter
analyzer allows you to measure down
to the fA level. This application note
shows how to precisely evaluate sub-
threshold characteristics of a MOSFET
device using the 4156C’s ultra low
current measurement capability.
Safe operation of next-generation
sub-micron devices requires that
power dissipation and signal levels be
scaled accordingly. To successfully
characterize these devices and semi-
conductor processes, more precise
and noise free low current measure-
ments are needed. The Agilent 4156C
precision semiconductor parameter
analyzer allows you to measure down
to the fA level. This application note
shows how to precisely evaluate sub-
threshold characteristics of a MOSFET
device using the 4156C’s ultra low
current measurement capability.
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