Overview Agilent’s multipurpose scanners deliver unsurpassed performance, versatility, and ease of use for atomic force microscopy (AFM). They are ideal for imaging in fl uids or air and under controlled temperature and environmental conditions. These unique top-down scanners offer many key performance benefi ts. To deliver high-resolution imaging results, a patented pendulum scanner design is utilized that eliminates artifacts in the image by keeping the relative position of the laser spot fi xed in relation to the cantilever throughout the scan cycle. The top-down confi guration provides complete isolation of the scanning elements and electronics from the imaging environment, thus allowing total environmental control, fl uid-friendly operation, and superior thermal stability. As a result, samples can be imaged at temperatures up to 250° C over time periods as long as 10 hours.