×

Instrumented Indentation Testi

消耗积分:2 | 格式:rar | 大小:214 | 2010-08-16

分享资料个

Introduction
The scale of materials and machined
components continues to decrease
with advances in technology making
traditional test systems increasingly
more diffi cult to use for determining
mechanical properties. For this reason
instrumented indentation testing (IIT) or
depth sensing indentation (DSI) testing
is becoming the technique of choice for
determining mechanical properties of
materials on the micro and nano scales.
Based off of research by Sneddon,
W.C. Oliver and G.M. Pharr published
a landmark paper on IIT in 1992, which
laid the foundation for much of the
ongoing research and development
in the fi elds of materials science and
engineering. The instrument used for
this seminal paper was the fi rst design
of what has now become Agilent’s
Nano Indenter G200.

声明:本文内容及配图由入驻作者撰写或者入驻合作网站授权转载。文章观点仅代表作者本人,不代表电子发烧友网立场。文章及其配图仅供工程师学习之用,如有内容侵权或者其他违规问题,请联系本站处理。 举报投诉

评论(0)
发评论

下载排行榜

全部0条评论

快来发表一下你的评论吧 !