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How to Choose your MAC Lever S
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2010-08-10
陆军航空兵
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Introduction
Atomic force microscopy (AFM) is
a sub-nanometer scale imaging and
measurement tool that can be used to
determine a sample’s surface topology
and measure its mechanical properties.
AFM imaging relies on a small AFM probe
that is raster scanned over a surface to
generate an AFM image. As shown in
fi gure 1, AFM probes have two major
components; a fl exible cantilever, which
is attached to the probe chip, and a sharp
probe tip near the end of the cantilever.
The cantilevers generally have either
triangular or rectangular geometries.
AFM probes can be manufactured from a
variety of materials, but most are made of
silicon and/or silicon nitride (Si3N4).
Atomic force microscopy (AFM) is
a sub-nanometer scale imaging and
measurement tool that can be used to
determine a sample’s surface topology
and measure its mechanical properties.
AFM imaging relies on a small AFM probe
that is raster scanned over a surface to
generate an AFM image. As shown in
fi gure 1, AFM probes have two major
components; a fl exible cantilever, which
is attached to the probe chip, and a sharp
probe tip near the end of the cantilever.
The cantilevers generally have either
triangular or rectangular geometries.
AFM probes can be manufactured from a
variety of materials, but most are made of
silicon and/or silicon nitride (Si3N4).
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