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Imaging and Indenting: The Pro
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2010-08-17
胡秋阳
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Atomic-force microscopes (AFMs)
and nanoindenters (NIs) both work by
probing a surface. AFMs are specially
designed for high-resolution imaging,
and NIs are specially designed for
measuring mechanical properties.
However, because AFMs and NIs
share some operating principles,
their functions have some degree of
crossover. The principles of profi lometry
and nanoindentation are explained in
detail elsewhere [1, 2]. The purpose
of this note is to explain the design
features that make each type of
instrument well suited for its intended
function. This note also addresses
the pros and cons of using one type
of instrument to perform the intended
function of the other.
and nanoindenters (NIs) both work by
probing a surface. AFMs are specially
designed for high-resolution imaging,
and NIs are specially designed for
measuring mechanical properties.
However, because AFMs and NIs
share some operating principles,
their functions have some degree of
crossover. The principles of profi lometry
and nanoindentation are explained in
detail elsewhere [1, 2]. The purpose
of this note is to explain the design
features that make each type of
instrument well suited for its intended
function. This note also addresses
the pros and cons of using one type
of instrument to perform the intended
function of the other.
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