The design capacity that can be realized on a single integrated circuit (IC) at deep
sub-micron (DSM) technology levels makes it feasible to integrate all major functions
of an end product in a single system-on-a-chip (SOC). But the evolution to
SOC design presents challenges to the traditional verification approaches.

声明:本文内容及配图由入驻作者撰写或者入驻合作网站授权转载。文章观点仅代表作者本人,不代表电子发烧友网立场。文章及其配图仅供工程师学习之用,如有内容侵权或者其他违规问题,请联系本站处理。 举报投诉
全部0条评论
快来发表一下你的评论吧 !