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Polarization-Resolved Measurem
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2010-07-23
王平
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The performance of optical components can have
significant dependence on polarization, as with the
difference between TE and TM polarization in planar
devices like AWG and SOA. Determination of the
optical properties for the principal states of polarization
can be needed, for instance to determine the
polarization dependent wavelength of a bandpass filter.
It can be complicated to adjust instrumentation to
provide these polarization states. A fast and direct
method to do this based on Mueller matrix analysis is
described here.
significant dependence on polarization, as with the
difference between TE and TM polarization in planar
devices like AWG and SOA. Determination of the
optical properties for the principal states of polarization
can be needed, for instance to determine the
polarization dependent wavelength of a bandpass filter.
It can be complicated to adjust instrumentation to
provide these polarization states. A fast and direct
method to do this based on Mueller matrix analysis is
described here.
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