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单片开关电源TPS54350的失效分析
消耗积分:5 |
格式:rar |
大小:594 |
2011-01-04
韩刚龙
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分析和解决了开关电源TPS54350在小负载应用电路下的失效问题。通过对失效器件进行外观镜检、I-V曲线测试、X线检查，对典型应用电路的分析和异常测试波形分析找到了器件失效的根本原因。TPS54350典型应用电路在下电时存在反灌电流，且外接欠压保护电阻，由此引起的输入电压波动对输出使能ENA端间接干扰，从而使器件误启动，造成输出端电流反灌入器件，导致器件内部电路出现闩锁失效。采用TPS54550替换TPS54350（ENA端抗干扰能力更强），并去除UVLO端欠压保护电阻，解决失效问题，稳定地实现12V转5
- Abstract:
- This paper analyzes and solves the failure problems of integrated switching-power chip TPS54350in a small load applications circuit.It found the root causes of device failure by microscopic appearance test,I-V curve test,X-ray test to-wards the failure chip and the typical application circuit and the exception test waveform.The typical application circuit of TPS54350has an external voltage protection resistor,when power off,existing an anti-Sink current,causes the fluctuations of the input voltage which interferes the ENA of the chip indirectly.This falses start chips and makes the current of anti-chip poured into the chip from the outside and finally resulting in chip circuitry appears latch failure.using TPS54550to replace TPS54350（ENA-side have stronger anti-interference capability）,and removing the undervoltage protection resistance of UV-LO side,solves the failure problems,achieves the small load applications that12V transforms to5V,100mA.
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