资料下载
FLASH EPROM 多种芯片测试机介绍
liuxin
分享资料个
The T5375 is a General Purpose and High Performance Memory Test System.
This system has been designed to meet various requirement for the new generation VLSI memories and
evaluation of their characteristics and for the production of memories such as DRAM, SRAM, EPROM, Mask
ROM and Flash memories. T5375 contains the flash memory simultaneous measurement function as an
optional function.
During functional tests at a maximum test rate of 142.8MHz (7ns), the system ensure high timing accuracy,
high repeatability and high fault detect-ability. To meet the needs of increasing test time resulting from the
growing memory capacity, T5375 ensure high productivity by enabling up to 256 devices parallel testing at 2
stations. In additional to functional performance capabilities for various types of functional tests, highly
accurate timing and reference levels are provided which allows testing of NMOS, CMOS, TTL and other
devices at a station having 50 ohms characteristics. This system realizes miniaturization, low power and high
reliability by employing CMOS process.
声明：本文内容及配图由入驻作者撰写或者入驻合作网站授权转载。文章观点仅代表作者本人，不代表电子发烧友网立场。文章及其配图仅供工程师学习之用，如有内容侵权或者其他违规问题，请联系本站处理。 举报投诉
- 相关下载
- 相关文章
