Smart control system for LD aging test Ying Ruan*, Xuezhong Wang, Jing Guo, Weiling Guo,Bifeng Cui, Guangdi Shen (Electronic Information & Control Engineering College, Beijing University of Technology, Beijing 100022, China) Abstract: In this paper, a smart control system for semiconductor laser ageing test is described. Compared to prior system2, this system can work in constant current aging mode and in constant power aging mode at the same time based on a new driver circuit which is designed and optimized by MATLAB. The experiment tell that the control system perform well enough to apply in LD aging test. Key Words: semiconductor laser diode, aging test, screen, driver circuit, smart control system, MATLAB, optimum design