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4输入异步总线仲裁器（74F786）的亚稳性测试
消耗积分:3 |
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大小:55 |
2009-05-27
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Under contract with Signetics, Mr. Thomas J. Chaney of Washington
University, St. Louis tested a set of nineteen 74F786 samples
(packages) to determine the metastable state recovery statistics for
the circuits. The tests were conducted using a procedure described
in a paper entitled “Characterization and Scaling of MOS Flip-Flop
Performance”, (section IV), by T. Chaney and F. Rosenberger,
University, St. Louis tested a set of nineteen 74F786 samples
(packages) to determine the metastable state recovery statistics for
the circuits. The tests were conducted using a procedure described
in a paper entitled “Characterization and Scaling of MOS Flip-Flop
Performance”, (section IV), by T. Chaney and F. Rosenberger,
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