The atomic force microscope (AFM) is capable of imaging insulating materials with atomic resolution, thus making it an excellent tool for studying polymer surfaces. Atomic force microscopy can be used to measure many properties of polymers as well as surface structure, including friction, adhesion, and viscoelasticity. All of these measurements can be done without damaging preparative processes, such as metallic coating or placement in vacuums, which are common with many other analytical techniques. Additionally, AFM measurements can be performed at the molecular level. Atomic force microscopy was first applied to a polymer surface in 1988 (1); it has subsequently become a standard research tool in the field. This application note will focus on the utility of AFM for investigating various temperature- and humidity- dependent properties of polymers.