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EL7566 pdf datasheet (Monolith
消耗积分:3 |
格式:rar |
大小:555 |
2009-01-17
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The EL7566 is a full-feature synchronous step-down regulator
capable of up to 6A and 96% efficiency. The device operates
from 3V to 6V input supply (VIN). With internal CMOS power
FETs, the device can operate at up to 100% duty ratio,
allowing for an output voltage range of 0.8V to nearly VIN. An
adjustable switching frequency up to 1MHz enables the use of
small components, thereby reducing board area consumption
to under 0.72sq-in on one side of a PCB. The EL7566
operates in constant frequency PWM mode, making external
synchronization possible. A soft-start feature is integrated in
the EL7566 to limit in-rush currents and allow for a smooth
voltage ramp from zero to regulation. Other start-up features
are integrated to add flexibility for synchronizing many
supplies in multiple configurations. The EL7566 also offers a
voltage margining capability that shifts the output voltage ±5%
for validation of system card performance and reliability during
manufacturing tests. A junction temperature indicator
conveniently monitors the silicon die temperature, saving time
in thermal characterization.
capable of up to 6A and 96% efficiency. The device operates
from 3V to 6V input supply (VIN). With internal CMOS power
FETs, the device can operate at up to 100% duty ratio,
allowing for an output voltage range of 0.8V to nearly VIN. An
adjustable switching frequency up to 1MHz enables the use of
small components, thereby reducing board area consumption
to under 0.72sq-in on one side of a PCB. The EL7566
operates in constant frequency PWM mode, making external
synchronization possible. A soft-start feature is integrated in
the EL7566 to limit in-rush currents and allow for a smooth
voltage ramp from zero to regulation. Other start-up features
are integrated to add flexibility for synchronizing many
supplies in multiple configurations. The EL7566 also offers a
voltage margining capability that shifts the output voltage ±5%
for validation of system card performance and reliability during
manufacturing tests. A junction temperature indicator
conveniently monitors the silicon die temperature, saving time
in thermal characterization.
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