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用2651A实现各种瞬态特性分析应用

消耗积分:0 | 格式:pdf | 大小:340 KB | 2011-05-11

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Green initiatives and energy efficiency standards worldwide have motivated engineers to find ways to design more efficientsemiconductor devices and integrated circuits, and measuring the true state of these devices without the effects of self-heatingis critical. Test instruments with only DC capability can deliver enough power to a device to cause heat dissipation that altersits characteristics. Pulsed characterization is a solution to this issue.
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