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Low Current Measurement with
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2010-07-09
五斤麻辣油
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Introduction
As device geometry scales down, low
current must be precisely measured
to characterize the new generation
semiconductor devices and processes.
This application note introduces
Agilent’s new solution for precise
characterization of multiple semicon-
ductor devices by switching.
As device geometry scales down, low
current must be precisely measured
to characterize the new generation
semiconductor devices and processes.
This application note introduces
Agilent’s new solution for precise
characterization of multiple semicon-
ductor devices by switching.
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