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Maximizing Test Coverage with
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2010-07-29
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This paper describes how to get the most from Agilent Technologies’
industry-leading vectorless test innovation, the Medalist VTEP
hardware and software. It has been updated to include the latest
Medalist iVTEP technology.
VTEP is a combination of new hardware and software techniques,
which enable improvements over the noise characteristics, stability,
accuracy, and repeatability of TestJet measurements. This allows
Agilent board test systems using VTEP to make reliable readings at
much lower values than the original TestJet. This makes it possible to
test pins on devices and connectors that TestJet previously could not.
Taking this innovation further, iVTEP extends the measurement
capability of VTEP. It is enabled automatically by the 05.41 software
upgrade. With iVTEP, more accurate measurements can be made
on integrated circuits (ICs) using existing VTEP hardware. These
measurements are less dependent on lead-frame geometries than
VTEP or TestJet. AutoDebug has been updated to add iVTEP capability
automatically on a per-pin basis. Test development, hardware, and
fixturing are the same as those for VTEP.
The immediate benefit to the end-user of using both VTEP and iVTEP is
that more pins are covered on ever shrinking integrated circuits.
industry-leading vectorless test innovation, the Medalist VTEP
hardware and software. It has been updated to include the latest
Medalist iVTEP technology.
VTEP is a combination of new hardware and software techniques,
which enable improvements over the noise characteristics, stability,
accuracy, and repeatability of TestJet measurements. This allows
Agilent board test systems using VTEP to make reliable readings at
much lower values than the original TestJet. This makes it possible to
test pins on devices and connectors that TestJet previously could not.
Taking this innovation further, iVTEP extends the measurement
capability of VTEP. It is enabled automatically by the 05.41 software
upgrade. With iVTEP, more accurate measurements can be made
on integrated circuits (ICs) using existing VTEP hardware. These
measurements are less dependent on lead-frame geometries than
VTEP or TestJet. AutoDebug has been updated to add iVTEP capability
automatically on a per-pin basis. Test development, hardware, and
fixturing are the same as those for VTEP.
The immediate benefit to the end-user of using both VTEP and iVTEP is
that more pins are covered on ever shrinking integrated circuits.
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