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71M651x Reliability and Aging Data
消耗积分:5 |
格式:exe |
大小:66 KB |
2011-02-06
刘艳
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Reliability and Aging Data
This Application Note provides data on reliability and aging for the 71M651X family of energy metering chips.
Reliability
Below is an excerpt of a reliability calculation based on a burn-in experiment over a sample size of 440. The resulting MTBF is 34,069,741 hours, or 3,889 years.
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