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Data-Dependent Effects on Jitt
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2010-03-03
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Data-dependent jitter of transmitter for Non-Framed PRBS and SDH-Framed signal weresimulated. The results
showed that Jitter evaluation for transmitters should be identical to the Framed pattern used at the final
equipment testing.
©2006 Optical Society of America.
Introduction
When performing Jitter generation tests on optical transmitters for SDH/SONET/OTN, most device vendors use a
data pattern with randomly generated transitions like a Non-Framed Pseudo-Random Bit Sequence (PRBS) as a
test pattern. In contrast, when these devices are installed in transmission equipment, the final Jitter evaluation is
performed with an actual data pattern used by SDH/SONET/OTN which is Framed. As a consequence, there is
often a problem of inconsistent Jitter values between device vendors and equipment vendors. There are two main
reasons for this difference. First, the theoretical difference of Jitter values of the device under test (DUT) for the
Non-Framed and Framed signals, and parameters of DUT causing the difference, have never been verified
quantitatively. Second, the measurement error of the measurement method used by many Jitter testers (convert
Data signal to Clock and measure Clock Jitter) for the Non-Framed and Framed signals has never been quantified
and verified. This paper examines how the test data pattern affects the Jitter results by simulating measuring
equipment modeling the DUT and Jitter measurement method.
showed that Jitter evaluation for transmitters should be identical to the Framed pattern used at the final
equipment testing.
©2006 Optical Society of America.
Introduction
When performing Jitter generation tests on optical transmitters for SDH/SONET/OTN, most device vendors use a
data pattern with randomly generated transitions like a Non-Framed Pseudo-Random Bit Sequence (PRBS) as a
test pattern. In contrast, when these devices are installed in transmission equipment, the final Jitter evaluation is
performed with an actual data pattern used by SDH/SONET/OTN which is Framed. As a consequence, there is
often a problem of inconsistent Jitter values between device vendors and equipment vendors. There are two main
reasons for this difference. First, the theoretical difference of Jitter values of the device under test (DUT) for the
Non-Framed and Framed signals, and parameters of DUT causing the difference, have never been verified
quantitatively. Second, the measurement error of the measurement method used by many Jitter testers (convert
Data signal to Clock and measure Clock Jitter) for the Non-Framed and Framed signals has never been quantified
and verified. This paper examines how the test data pattern affects the Jitter results by simulating measuring
equipment modeling the DUT and Jitter measurement method.
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