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DDR验证和调试的高级方法

消耗积分:5 | 格式:rar | 大小:2888 | 2010-06-29

王飞云

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DDR验证和调试的高级方法:Memory Design and Validation
Chip/Component Design
Precise understanding of circuit behavior under range of
conditions
Margin testing
System Integration
Signal integrity and timing analysis, discovery of issues
under nominal conditions
Debug interoperability issues
Embedded Systems
Easy test setup
Quick pass/fail results

DDR Test Challenges
Signal Access & Probing
– Easy-to-use / reliable connections
– Bandwidth & Signal Integrity
– Affordable
Isolation of Read/Write bursts
– Triggering or Post-Processing
Complexity of JEDEC Conformance Tests
– Parametric timing/amplitude measurements
– Vref / Vih / Vil, Derating
Results Validity / Statistics
Effective Reporting / Archiving
Advanced Analysis
– Characterization
– Debug

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