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Agilent PDQ-WLRTM Test and Ana
消耗积分:3 |
格式:rar |
大小:580 |
2010-07-12
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Total PDQ-WLR Solution
The shortened production
lifetimes of modern semicon-
ductor processes have increased
the importance of wafer level
reliability (WLR) data. Today,
wafer fabs must use WLR data
from the production line to
ensure the reliability of their
devices. In addition, reduced
reliability qualification cycle
times are needed to speed new
IC processes to market. Used
properly, WLR can provide high
quality reliability data in a few
minutes that was previously
obtained through weeks of
reliability test done on packaged
test structures. This significantly
shortens the development cycle
time and results in faster time
to market with less cost.
The shortened production
lifetimes of modern semicon-
ductor processes have increased
the importance of wafer level
reliability (WLR) data. Today,
wafer fabs must use WLR data
from the production line to
ensure the reliability of their
devices. In addition, reduced
reliability qualification cycle
times are needed to speed new
IC processes to market. Used
properly, WLR can provide high
quality reliability data in a few
minutes that was previously
obtained through weeks of
reliability test done on packaged
test structures. This significantly
shortens the development cycle
time and results in faster time
to market with less cost.
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