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MAC Mode Atomic Force Microsco
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格式:rar |
大小:135 |
2010-08-02
362163
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Since its introduction, it has been recognized
that the atomic force microscope (AFM)
offers a unique ability to probe surface
forces with nanometer resolution and
that these surface forces play a vital role
in the operation of the AFM (1). We (2,
3) and others (4, 5) have introduced a
new approach to AFM in which a force
is applied directly to an AFM tip using a
magnetic field (MAC Mode AFM), rather
than by pressing the tip into the sample
with the scanning transducer. This method
eliminates the spurious resonances seen in
fluid tapping mode (3), leading to substantial
improvements in image quality (6). Here, we
discuss the application of MAC Mode AFM
to the measurement of surface forces.
that the atomic force microscope (AFM)
offers a unique ability to probe surface
forces with nanometer resolution and
that these surface forces play a vital role
in the operation of the AFM (1). We (2,
3) and others (4, 5) have introduced a
new approach to AFM in which a force
is applied directly to an AFM tip using a
magnetic field (MAC Mode AFM), rather
than by pressing the tip into the sample
with the scanning transducer. This method
eliminates the spurious resonances seen in
fluid tapping mode (3), leading to substantial
improvements in image quality (6). Here, we
discuss the application of MAC Mode AFM
to the measurement of surface forces.
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