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Application of Atomic Force Mi
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2010-08-03
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Introduction
Atomic force microscopy (AFM) is
a powerful characterization tool
for polymer science, capable of
revealing surface structures with
superior spatial resolution. AFM is
extremely useful for studying the
local surface molecular composi-
tion and mechanical properties of
a broad range of polymer materi-
als, including block copolymers,
bulk polymers, thin-film polymers,
polymer composites, and polymer
blends.
Atomic force microscopy (AFM) is
a powerful characterization tool
for polymer science, capable of
revealing surface structures with
superior spatial resolution. AFM is
extremely useful for studying the
local surface molecular composi-
tion and mechanical properties of
a broad range of polymer materi-
als, including block copolymers,
bulk polymers, thin-film polymers,
polymer composites, and polymer
blends.
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