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Agilent Scanning Tunneling Mic

消耗积分:2 | 格式:rar | 大小:251 | 2010-08-01

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Features and Benefits
•Wide range of current sensitivity
provides guaranteed atomic-
resolution imaging of conducting
surfaces
•Designed for imaging in ambi-
ent, controlled gas, or in a fluid
environment
•Top-down configuration protects
electronics and piezo elements
from damage caused by harsh
imaging environments
•Full compatibility with Agilent’s
modular AFM/SPM microscopes
offers simple upgrade path for
extended capabilities
•Easy fluid exchange permits
greater EC-STM versatility

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