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C8051F023 pdf datasheet (64 kB
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格式:rar |
大小:3333 |
2008-10-10
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Analog Peripherals
10-Bit ADC
- !à1 LSB INL; no missing code
- Programmable throughput up to 100 ksps
- 8 external inputs; programmable as single-ended or differential
- Programmable amplifier gain: 16, 8, 4, 2, 1, 0.5
- Data-dependent windowed interrupt generator
- Built-in temperature sensor (!à !aC
8-Bit ADC
- !à1 LSB INL; no missing code
- Programmable throughput up to 500 ksps
- 8 external inputs
- Programmable amplifier gain: 4, 2, 1, 0.5
Two 12-Bit DACs
- Can synchronize outputs to timers for jitter-free waveform generation
Two Comparators
Internal Voltage Reference
V Monitor/Brown-out Detector
DD
On-Chip JTAG Debug & Boundary Scan
- On-chip debug circuitry facilitates full speed, non-intrusive in-system
debug (no emulator required)
- Provides breakpoints, single stepping, watchpoints, stack monitor
- Inspect/modify memory and registers
- Superior performance to emulation systems using ICE-chips, target
pods, and sockets
- IEEE1149.1 compliant boundary scan
10-Bit ADC
- !à1 LSB INL; no missing code
- Programmable throughput up to 100 ksps
- 8 external inputs; programmable as single-ended or differential
- Programmable amplifier gain: 16, 8, 4, 2, 1, 0.5
- Data-dependent windowed interrupt generator
- Built-in temperature sensor (!à !aC
8-Bit ADC
- !à1 LSB INL; no missing code
- Programmable throughput up to 500 ksps
- 8 external inputs
- Programmable amplifier gain: 4, 2, 1, 0.5
Two 12-Bit DACs
- Can synchronize outputs to timers for jitter-free waveform generation
Two Comparators
Internal Voltage Reference
V Monitor/Brown-out Detector
DD
On-Chip JTAG Debug & Boundary Scan
- On-chip debug circuitry facilitates full speed, non-intrusive in-system
debug (no emulator required)
- Provides breakpoints, single stepping, watchpoints, stack monitor
- Inspect/modify memory and registers
- Superior performance to emulation systems using ICE-chips, target
pods, and sockets
- IEEE1149.1 compliant boundary scan
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