EIA STANDARD TP-48A METALLIC COATING THICKNESS MEASUREMENT OF C CONTACTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS EIA/ECA-364-48-A This EIA standard has been superseded by the following ASTM specifications Description EIA-364-48 test method ASTM equivalent Microsection – Optical Method A ASTM B-487 Microsection – SEM ASTM B-748 Bata backscatter Method B ASTM B-567 X-ray fluorescence Method C ASTM B-568 Eddy current Method D ASTM B-244 Coulometry Method E ASTM B-504 Weight gain Method F ASTM B-767 EIA/ECA-364-48A (Revision of EIA-364-48) MARCH 2006 ELECTRONIC COMPONENTS, ASSEMBLIES & MATERIALS ASSOCIATION THE ELECTRONIC COMPONENTS SECTOR OF THE ELECTRONIC INDUSTRIES ALLIANCE