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基于BIST的编译码器IP核测试
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2010-12-13
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介绍了用于IP核测试的内建自测试方法(BIST)和面向测试的IP核设计方法，指出基于IP核的系统芯片(SOC) 的测试、验证以及相关性测试具有较大难度，传统的测试和验证方法均难以满足。以编译码器IP核为例，说明了基于BIST的编译码器IP核测试的基本实现原理和具体实现过程，通过加入测试外壳实现了对IP核的访问、隔离和控制，提高了IP核的可测性。
- Abstract:
- The built-in self test(BIST)method for IP core and the design method for test-oriented IP core are introduced. Test, certification and related testing for SOC (system on chip) based on IP core are more difficult and the traditional testing methods are difficult to satisfy all requirements. The principium and the realization of IP core test based on BIST arre presented through the example of Encoder and Decoder IP core. Accessing, insulation and control of IP core were realized by adding a test wrapper, and then the testability of the IP core is enhanced.
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