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AK2574 pdf datasheet (156M Las
消耗积分:3 |
格式:rar |
大小:433 |
2009-01-16
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Note 1: This parameter is characterized and is not 100% tested.
Important Notice: The AKM factory adjusted data are stored in advance at address location (Device Address = A6h,
Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to
the AK2574 which exceeds a guaranteed EEPROM data retention conditions (for 10 years at 85℃), it is important to
read the pre-determined value in advance and to re-write the same data back into EEPROM after an exposure to the
excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated
temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to
re-write it after the test. Access to un-used address locations is not functionally guaranteed.
Refer to section-Ⅵ 5.3 for EEPROM map.
Important Notice: The AKM factory adjusted data are stored in advance at address location (Device Address = A6h,
Address = 60h) for the offset of the on-chip temperature sensor. If such excess temperature stress is to be applied to
the AK2574 which exceeds a guaranteed EEPROM data retention conditions (for 10 years at 85℃), it is important to
read the pre-determined value in advance and to re-write the same data back into EEPROM after an exposure to the
excess temperature environment. Even if the exposure time is shorter than the retention time, any accelerated
temperature stress tests (such as baking) are performed, it is recommended to read the pre-set data first and to
re-write it after the test. Access to un-used address locations is not functionally guaranteed.
Refer to section-Ⅵ 5.3 for EEPROM map.
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