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HP 4155B/4156B Semiconductor P
消耗积分:3 |
格式:rar |
大小:518 |
2010-07-13
李鸿洋
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Wide Application Capability
The HP 4155B/4156B has increased
measurement performance and also
includes powerful functions useful
for testing the next generation of
semiconductor devices. The
functions are accessible via an easy-
to-use operating interface similar to
the HP 4145A/4145B. Table 1 shows
examples of measurements that can
be made using the HP 4155B/4156B.
The HP 4155B/4156B has increased
measurement performance and also
includes powerful functions useful
for testing the next generation of
semiconductor devices. The
functions are accessible via an easy-
to-use operating interface similar to
the HP 4145A/4145B. Table 1 shows
examples of measurements that can
be made using the HP 4155B/4156B.
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