Features and Benefits •High-performance atomic force microscope designed for multi- ple-user labs and educational environments •Cost-effective, modular solution offers easy upgrade path •Single multipurpose scanner with interchangeable nose cones makes setting up and switching imaging modes quick and simple •Open-top scanner affords easy video access •On-line training available to assist new users •Unobstructed optical view of the cantilever facilitates tip-sample alignment •Rigid mechanical design provides low noise floor for subnanometer resolution •Several sample-handling plates available to simplify sample preparation