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EIA/JEP134 SEPTEMBER 1998

消耗积分:3 | 格式:rar | 大小:666 | 2008-08-10

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This Guideline addresses acquiring and transmitting pertinent background information that a
failure analyst should have to complete an accurate and timely failure analysis of a semiconductor
device. To this end, a suggested background-data form and explanations of its data items are
included.

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